Houck, Max M.  <br/><br/>Fundamentals of forensic science/ Max M. Houck and Jay A. Siegel.  -- 2nd ed.   -- USA:  Elsevier Ltd.,  2010. <br/>xvii, 661 p.:  col ill.;  25 cm.  <br/><br/> Includes bibliographical indexes.  <br/><br/><label>ISBN: </label>9780123749895 <br/><br/><label>Subjects--Topical Terms: </label><br/>Forensic sciences. <br/>Criminal investigation. <br/><br/><label>Dewey Class. No.: </label>Res 363.25 H812 2010