Fundamentals of forensic science/ Max M. Houck and Jay A. Siegel.

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TextPublication details: USA: Elsevier Ltd., 2010.Edition: 2nd edDescription: xvii, 661 p.: col ill.; 25 cmISBN:

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Holdings
Cover image	Item type	Current library	Home library	Collection	Shelving location	Call number	Materials specified	Vol info	URL	Copy number	Status	Notes	Date due	Barcode	Item holds	Item hold queue priority	Course reserves
	Books	Reserved and General Collection Section	Olivarez College Learning Resource Center			RES 363.25 H812 2010 (Browse shelf(Opens below))					Available			RES 003967

Includes bibliographical indexes.

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