000 02335nam a22003017a 4500
001 16929
003 OCLRC
005 20260731013049.0
008 260622t xxu||||| |||| 00| 0 eng d
040 _aOCLRC
082 _aT 616.07572 2025 0065
100 _aJayoma, Hazel L.
245 _aInvestigating the challenges intrauma radiography among Radiologic Technology Interns/
_cHazel L. Jayoma, Liane C. Lopez, Nadine L. Oasano, Ellyza Yzavelle B. Sido , Patricia F. Tenorio , & Francine Danielle D. Torcelino.
260 _aParañaque City:
_bOlivarez College,
_c2025.
502 _aUndergraduate thesis
520 _a Interns in radiologic technology encounter various challenges during their internship,especially when it comes to trauma radiography the purpose of this study is to look into the difficulties and its impacts on their well-being. The time-sensitive and high-pressure nature of trauma radiography present unique obstacles for interns, such as managing high-stress circumstances, treating vital patients, and adjusting to fast-paced clinical settings.Using a semi-structured interview and a phenomenological approach to distill the core of their lived experiences. Thematic Analysis was used in analysing qualitative data by identifying significant themes or patterns,which were analyzed and summarized to develop an interpretation. Findings indicate that interns frequently feel unprepared due to lack of practical training in complex trauma cases, technical challenges, and emotional stress it brings. These difficulties, at the same time,help them become more resilient,adaptive and experts. These results highlight the significance of improving trauma radiography instruction in academic programs and offering more through internship support. The study intends to improve clinical experience and better educate students for the challenging nature of trauma imaging by informing future radiologic education programs.
650 _aanatomy.
653 _aclinical setting.
653 _apositioning.
653 _atrauma radiography.
653 _avehicular accidents.
700 _aLopez, Liane C.
700 _aOsano, Nadine L.
700 _aSido, Ellyza Yzavelle B.
700 _aTenorio, Patricia F.
700 _aTorcelino, Francine Danielle D.
942 _cTHES
_jT 616.07572 2025 0065
999 _c16929
_d16929